2020年7月30日布魯克推出了ZUI新一代超高速原子力顯微鏡NanoRacer?。NanoRacer?憑借其50幀/秒的超高速成像，實現了真正意義上視頻級成像速度下單個生物分子的動態觀察。NanoRacer?的革新性的技術突破，在AFM發展史上樹立了新的里程碑。布魯克BioAFM研發團隊與生命科學領域的專家緊密合作，使NanoRacer?不僅擁有超高掃描速率與原子級別分辨率，而且擁有杰出的易用性，使得對單分子動態過程的捕捉變得十分便捷，為深入理解生物物理、生物化學、分子生物學、病毒學以及生物醫學等領域的單分子動態過程提供了強大工具。

全新的NanoRacer?采用了新的架構結合更低噪音、更高穩定性的Vortis? 2控制器，全新的驅動算法與力控制算法，可以在超高速下獲取高分辨的生物樣品信息。新系統整合了基于工作流程的V7操作軟件，直觀的用戶界面與流程化、自動化的設置使得研究人員可以專注于自己的實驗，加速高端研究的產出能效。

Specifications

Maximum scan speed of up to  50 frames/sec with 100 ×100 nm2 scan range and 10 k pixels

• Atomic defect resolution in  closed-loop

• Designed for medium to small sized cantilevers for lowest forces and highest scan speeds

• Ultra-low noise cantilever-deflection detection system

• IR cantilever-deflection detection light  source with small spot size

• Optional photothermal cantilever drive. 730 nm wavelength ensures minimal sample interaction compared to blue-light excitation

• Highest detector bandwidth of  8 MHz for high speed signal capture

• Automated laser and detector   alignment

• Scanner unit

• 2 × 2 × 1.5 μm3 scan range

• Sensor noise level < 0.09 nm RMS in xy

• 0.04 nm RMS sensor noise level in z

• Highest resonance frequency for z axis of >180 kHz

• Typical sample size 4 mm diameter

Control electronics

• Vortis 2 Speed controller: State-of-the-art, digital controller  with lowest noise levels and  highest flexibility

• Newly designed, high-voltage power amplifier drives the scanner unit

New workflow-based V7 SPMControl software

• True multi-user platform, ideal for imaging facilities

• User-programmable software

• AutoAlignment and setup

• Advanced feedback algorithms

• Fully automated sensitivity and spring constant calibration using thermal noise or Sader method

• Improved ForceWatch? and  TipSaver? mode for force spectroscopy and imaging

• Advanced spectroscopy modes, e.g. various force clamp modes or ramp designs

• Powerful Data Processing (DP) with full functionality for data export, fitting, filtering, edge detection, 3D rendering, FFT, cross section, etc.

• Powerful batch processing of force curves and images, including WLC, FJC, step-fitting, JKR, DMT model and other analyses